Gaya APA

Neko, M. et al (2013). Analysis of hole lifetime in SOI MOSFET single-photon detector (Vol. 17, No. 1, Tahun). : American foundations information service.

Gaya MLA

Neko, Maneki. et al. "Analysis of hole lifetime in SOI MOSFET single-photon detector". Vol. 17, No. 1, Tahun : American foundations information service, 2013. Text.